Semiconductor manufacturing is a fast moving industry; more and more devices are highly integrated with various functions. Capital equipment must be built to outlive several device generations and applications. With varieties of available options, such as AD/DA converter test, ALPG for memory test, high voltage PE, multiple scan chain test, VI45, PVI100 & MPVI analog test options, ASO & HDADDA mixed-signal test options, Chroma 3650 can provide a wide coverage for customer to test different kind of devices with flexible configurations.
Chroma 3650是SOC测试人员，具有高通量和高平行测试功能，可为Fables，IDM和测试房屋提供最具成本效益的解决方案。3650具有完整的测试功能，高精度，功能强大的软件工具和出色的可靠性，具有用于高性能微控制器，模拟IC，消费者Soc设备和晶圆排序应用程序的多功能测试功能。
低成本生产系统中的高性能
The 3650 achieves lower test cost not only by reducing the cost of tester system but also by testing more devices faster and the high parallel test capability. With the Chroma PINF IC and the sophisticated calibration system, 3650 has the excellent overall timing accuracy within ±550ps. The pattern generator of 3650 has up to 32M pattern instruction memory. By having the same depth as the vector memory, Chroma 3650 allows to add pattern instruction for each vector.
Moreover, the powerful sequential pattern generator provides the variety of pattern commands to meet the demands of complex test vectors. The true test-per-pin architecture and the flexible site mapping with no slot boundaries are designed for multi-site test with high throughput. Up to 640 digital pins, 32 device power supplies, per-pin PMU and the analog test capability, 3650 delivers a combination of high test performance and throughput with cost-effective test solution.
High Parallel Test Capability
The powerful, versatile parallel pin electronics resources of 3650 can simultaneously perform identical parametric tests on multiple pins. The 3650 integrates 64 digital pins onto one single LPC board. In each LPC board, it contains 16 high performance Chroma PINF ICs which supports 4 channels timing generator. The integration of local controller circuitry manages resources setup and result readout, and therefore cuts the overhead time of the system controller. With the any-pin-to-any-site mapping design,3650 provides up to 32 sites high throughput parallel testing capabilities to enlarge the mass production performance with more flexible and easy layout.
灵活性
半导体行业是一个快速移动的行业，必须建造资本设备以超过几代设备的几代和应用程序。具有多种可用选项，例如AD / DA转换器测试，用于存储器测试的ALPG，高压PE，多扫描链测试，VI45和PVI100和MPVI模拟选项，Chroma 3650可确保它可以为您服务多年。
此外，Chroma 3650平台体系结构允许第三方供应商开发专注的仪器，可以轻松地为特定应用程序添加。它可以通过在低成本生产测试系统中覆盖比以往任何时候都更广泛的设备来扩展测试的界限。
小足迹
With the air-cooled and small footprint tester-in-a-test-head design, 3650 delivers high throughput in a highly integrated package for minimum floor space. A mainframe cabinet contains the power distribution units and the space for third-party instruments. With an optional manipulator, 3650 can be used in both package and wafer test.
