Among several fac tor s for PV to achieve grid-parity, reliability of the PV modules plays an important role. Since it's known that some of the cell defects such as edge chips/ flakes, bumps of cell surface were proved to be source of infant mortality of the c-Si PV modules, therefore, to detect those defects is very important for c-Si cell manufacturers.
但是，大多数细胞缺陷均由晶片遗传。因此，细胞和晶圆缺陷检查对最终的PV模块质量和可靠性至关重要。
Due to the inc rea s ing BIPV and roof top application, even for those defects that does not directly link to reliability issues such as water mark, surface stain, have to detected and considered as fail or secondary grade of cells for c-Si cell buyers.
Conventionally, those defects were visually inspected by operators. But, the inconsistent inspect result makes fully automatic optical inspection (AOI) solution becomes unavoidable equipment for c-Si cell & wafer lines.
Chroma 7200系列专门设计用于检测针对所有尺寸和结晶的C-SI细胞和晶圆观察到的各种缺陷。基于该过程需求，八名检查员都可以适合传入的晶圆和最终的单元格分类要求。
| Function Guide | 7201 | 7202 | 7210 | 7212-hs | 7231 | 7213-AD | 7214-D |
|---|---|---|---|---|---|---|---|
| Sawmark | ✔ | ||||||
| 几何学 （长度，角度，区域等） |
✔ | ||||||
| Surface stain （粒子，水痕，手指印刷，...等） |
✔ | ✔ | ✔ | ✔ | ✔ | ✔ | |
| Printing defect (Fat, interruptions, nodes,...etc) |
✔ | ✔ | ✔ | ||||
| Color defect （着色，变化，斑点等） |
✔ | ✔ | ✔ | ||||
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