Addressing the Testing Needs for All Types of Semiconductor Components
The world is pushed to change by the advance in semiconductor technologies. This is the time when artificial intelligence meets 5G, when autonomous cars meets big data analysis, with everything consolidated into a portable device. Semiconductor test systems need to be transformed to a new era where all sorts of features needs to be integrated into a tiny system. The emerging PXIe based platform provides a good viable path to fulfill the needs in the new era. Chroma's PXIe Semiconductor Test Solutions give our clients a versatile workplace to complete the semiconductor test while integrating functional instrument modules from different suppliers.
The First PXIe Card for All You Need Around Load Board Electronics
负载板是半导体测试系统中最重要的接口电子设备。对于应用程序中的所有各种需求，可能会添加各种组件，以点燃电源LED，模拟实际应用程序环境，多重为成本注意事项，甚至还记录设备中的输出以获取数据- 杂货用途。Chroma 33011通用继电器控制卡为您提供了可以在负载板上实现的所有内容 - 继电器，DC源，SPI通道和触发信号。用户不需要购买多张PXIE卡，也不需要占用稀缺的测试资源来管理负载板上的需求。它节省了更多的PXIE插槽 - 例如更高的站点计数以获取更多输出。
专有软件，工艺和其他软件支持的丰富功能
In addition to supporting the LabView and LabWindows environment, Chroma provides a proprietary software suite, CRAFT. CRAFT, running on Microsoft Windows operation system, contains the full set of tools for semiconductor test from test program development, debugging, production and maintenance. The production tools include easy-of-use GUI software such as Operator Interface, Test data output, Binning and Sequence Control, Wafer Map, Summary Tool, and rich sets prober/handler drivers. The user debugging tools includes the Datalog, Plan Debug, TCM, Shmoo, Pattern Editor, Waveform, etc. It also supports LabView and LabWindow environment and a subset of debugging tools are provided. In addition, a third party CAD to ATE pattern conversion tool is also supported to cover the WGL/STIL/VCD/EVCD conversions.
